Using the Test Harness¶
Environment Setup¶
Before building the design with the AIE test harness, you need to source the setup.sh
script included in this repository. You should also ensure that Vitis, XRT, Versal SDKTARGETSYSROOT
, and LD_LIBRARY_PATH
are properly set.
source <path to Versal common image>/environment-setup-cortexa72-cortexa53-xilinx-linux source <path to Vitis installation>/settings64.sh source <path to XRT installation>/setup.sh source <test harness repo root folder>/setup.sh export LD_LIBRARY_PATH=<your gcc installation>/lib64:$LD_LIBRARY_PATH
Instrumenting the AI Engine Graph¶
The following modifications are required to connect the user AIE graph to the test harness:
Test Harness Header File¶
The test harness graph header must be included in the AIE graph sources:
#include "test_harness_graph.hpp"
Mapping PLIOs¶
The names and width of the available PLIOs are predefined in the test harness. The original AIE graph must be mapped to these predefined PLIOs to make sure the PL data mover can be correctly connected to the user AIE graph.
The user AIE graph must be modified to ensure that all PLIOs are 128 bits wide and use the PLIOs predefined in the test harness.
The predefined PLIO names are listed in include/test_harness_port_name.hpp. The test_harness::in_names
is the list of PLIO names which can be used to send data to AI Engine and test_harness::out_names
is the list of PLIO names that can be used to receive data from AI Engine. These are the ONLY valid PLIOs to be built with the test harness.
Example
pl_in0 = input_plio::create("PLIO_01_TO_AIE" , adf::plio_128_bits, "DataIn0.txt"); pl_in1 = input_plio::create("PLIO_02_TO_AIE" , adf::plio_128_bits, "DataIn1.txt"); pl_out = output_plio::create("PLIO_01_FROM_AIE", adf::plio_128_bits, "DataOut0.txt");
Occupying unused PLIOs¶
All the PLIO ports defined in the test harness must be connected. In case the AIE graph does not need all the PLIOs defined in the test harness, an instance of the test_harness::occupyUnusedPLIO
helper class must be added to the graph.cpp
file. This class will help user to occupy all the PLIOs which are not used by the user AIE graph.
template <int used_in_plio, int used_out_plio, int max_num_plio> class occupyUnusedPLIO; template <int used_in_plio, int used_out_plio, int max_num_plio> occupyUnusedPLIO::occupyUnusedPLIO(std::vector<std::string> used_in_plio_names, std::vector<std::string> used_out_plio_names);
Templates
used_in_plio
- The number of input PLIOs used in the AIE graph
used_out_plio
- The number of output PLIOs used in the AIE graph
max_num_plio
- Maximum number of PLIOs pre-defined in XSA (36 for VCK190, 16 for VEK280)
Parameters
used_in_plio_names
- Vector of strings containing the names of the input PLIOs used by the AIE graph. The length of the vector must match the value of the
used_in_plio
template argument used_out_plio_names
- Vector of strings containing the names of the output PLIOs used by the AIE graph. The length of the vector must match the value of the
used_out_plio
template argument
Example
#include "test_harness_graph.hpp" static std::vector<std::string> cust_in = {"PLIO_01_TO_AIE", "PLIO_02_TO_AIE"}; static std::vector<std::string> cust_out = {"PLIO_01_FROM_AIE"}; test_harness::occupyUnusedPLIO<2, 1, 36> unusedPLIOs(cust_in, cust_out);
Creating the SW Application¶
A SW application running on the embedded ARM core (PS) of the Versal is necessary to run the test. This SW application must be developped using the test harness software APIs.
The application usually ressembles the structure and contents of graph.cpp
file used in x86sim and AIEsim. The main difference is that a different set of APIs is used to transfer data and interact with the AIE graph.
For additional details, refer to the step by step example section in this documentation, or the example provided in this repo, such as examples/vck190/adder/ps/host.cpp.
Testing on Hardware¶
Once the AIE graph has been modified and the SW application has been created, the test can be built and run on the hardware board.
Building the test application is done in three simple steps:
- Building the AIE graph
- Building the SW application
- Packaging the libadf.a, host_elf and other files to create a bootable SD card image
Building the AI Engine Graph¶
To build the libadf.a for use with the test harness, it must be compiled using the desired prebuilt XSA as the input platform, with the hw
target, and setting the --event-trace
and --event-trace-port
options as shown below:
The prebuilt XSAs are vck190_test_harness_func.xsa
for functional testing on VCK190, vck190_test_harness_perf.xsa
for performance testing on VCK190 and vek280_test_harness.xsa
for performance testing on VEK280.
v++ -c --mode aie --platform=${TEST_HARNESS_REPO_PATH}/bin/<vck190_test_harness_func.xsa/vck190_test_harness_perf.xsa/vek280_test_harness.xsa> --target=hw --aie.event-trace runtime --aie.event-trace-port gmio --I ${TEST_HARNESS_REPO_PATH}/include/ [other user options]
Building the SW Application¶
The SW application must be compiled with the ARM cross-compiler and using the Xilinx Runtime (XRT) libraries.
source <path to Versal common image>/environment-setup-cortexa72-cortexa53-xilinx-linux ${CXX} test.cpp -c -I${XILINX_XRT}/include -I${TEST_HARNESS_REPO_PATH}/include -o test.o ${CXX} test.o -lxrt_coreutil -L${XILINX_XRT}/lib -o host_elf
Packaging the Test¶
The AIE test harness includes utility scripts which can be used to package the test files and generate a bootable SD card image to run the test on the hardware board on either VCK190 or VEK280.
VCK190
test_harness/package_<vck190/vek280>_hw.sh <output dir> <func_libadf.a> <perf_libadf.a> <host_elf> <other files needed by the test>
VEK280
test_harness/package_<vck190/vek280>_hw.sh <output dir> <perf_libadf.a> <host_elf> <other files needed by the test>
Parameters
<output dir>
- The folder in which the output of the packaging script and the bootable SD card image should be generated.
<func_libadf.a>
- The libadf.a resulting from compiling the AIE graph with the pre-compiled .xsa for functional testing (vck190_test_harness_func.xsa).
<perf_libadf.a>
- The libadf.a resulting from compiling the AIE graph with the pre-compiled .xsa for performance testing (vck190_test_harness_perf.xsa or vek280_test_harness.xsa).
<host_elf>
- The executable resulting from building the SW application.
<other files needed by the test>
- A list of other files needed by the test and to be packaged in the SD card image. This can be for instance input data files required by the test application and the running script for executing the application test.
Software Emulation (VCK190 only)¶
The AIE test harness also provides support for packaging and running the test in the software emulation mode for VCK190.
In the software emulation mode, the AIE graph is compiled for x86sim and the SW application is compiled using the native compiler of the host system.
This mode allows testing the SW application and making sure that it works correctly before running the test on hardware.
Building the AI Engine Graph
Building the AIE graph for software emulation is similar to building it for HW, except that the x86sim
target should be used:
v++ -c --mode aie --platform=${TEST_HARNESS_REPO_PATH}/bin/<vck190_test_harness_func.xsa/vck190_test_harness_perf.xsa> --target=x86sim --aie.event-trace runtime --aie.event-trace-port gmio --I ${TEST_HARNESS_REPO_PATH}/include/ [other user options]
Building the SW Application
Building the SW application for software emulation is similar to building it for HW, except that the native g++ compiler should be used:
g++ test.cpp -c -I${XILINX_XRT}/include -I${TEST_HARNESS_REPO_PATH}/include -o test.o g++ test.o -lxrt_coreutil -L${XILINX_XRT}/lib -o host_elf
Packaging the Test
Packaging the test for software emulation is similar to packaging it for HW, except that the package_sw_emu.sh script should be used:
test_harness/package_sw_emu.sh <output dir> <func_libadf.a> <perf_libadf.a> <host_elf> <other files needed by the test>
Running SW emulation
To run the test in software emulation mode, first set the XCL_EMULATION_MODE
variable to sw_emu
before running the natively compiled test application:
cd <sw emu output dir> export XCL_EMULATION_MODE=sw_emu ./host_elf <optional args>
Troubleshooting¶
AIE Compilation¶
Issue: The following error message is seen when compiling the AIE graph with the test harness XSA: ERROR: [aiecompiler 77-4252] For application port with annotation 'PLIO_01_TO_AIE' the buswidth is 32-bits, which is different than the buswidth of 128-bits as specified in incoming logical architecture
- The width of the PLIOs in the prebuilt XSA is set to 128 bits. The PLIO widths in the AIE graph must match with the XSA. Set all PLIO width in the graph to
adf::plio_128_bits
.
Issue: The following error message is seen when compiling the AIE graph with the test harness XSA: ERROR: [aiecompiler 77-295] Cannot find port instance tf0_pi0 corresponding to Logical Arch Port M00_AXI
- The
--aie.event-trace runtime --aie.event-trace-port gmio
options are missing for thev++ -c --mode aie
command
AIE Simulation¶
Issue: The following error message is seen when running x86sim or AIEsim after modifying the graph to work with the test harness: Error: Could not open input file : ./data/dummy.txt
- The unused PLIOs are expecting an input data file called
./data/dummy.txt
. Create an empty file with this name and in this folder, then rerun x86sim or AIEsim.
HW Testing¶
Issue: When running on HW, the performance numbers reported by the test harness vary a lot from run to run.
- Making sure to start the AIE graph before starting the PL DMA engine. The performance counters start at the same time as the PL DMA engine starts. If the graph is not already started and ready to transfer data, the performance counters will be incremented by an arbitrary number of cycles before the application actually starts.